Fig. 2From: A 10-year survival rate of tapered self-tapping bone-level implants from medically compromised Korean patients at a maxillofacial surgical unitScanning electron microscopy (SEM) view of the surface morphology of the self-tapped bone level, sand-blasted, and acid-etched surface. The SEM was operated at 20 kV. The secondary electron (SE) detection mode was used for the ultrastructural surface analysis. SEM × 60 magnification view (a), × 500 magnification view (b), × 1000 magnification view (c), and × 5000 magnification view (d)Back to article page